Daido Bunseki Research Inc.

Service
contents
Chemical Analysis
Physical Measurement
Organic Analysis
Sample Preparation
Material Evaluation
Environmental Measurement/Analysis
Analysis Examples
Equipment List
Physical Measurement
Physical Measurement

　Introduction of Analysis & Testing Equipment
　Surface/Structure Analysis Equipment: 03-03--Electron probe micro-analyzer (EPMA)--
JXA-8900RL EPMA-1600
Exterior View (left: JEOL JXA-8900RL right: Shimadzu Corporation EPMA-1600)
　Principle The sample is placed in a vacuum and irradiated with 4nm to 100m electron beams, then the image is acquired from the intensity of characteristic X-rays, backscattered electrons, or secondary electrons generated from the measurement site.
　Usage (1) Element segregation, mapping examination
(2) Comparison of tint between elements
(3) Surface analysis
Device specifications
Equipment name JXA-|8900RL EPMA-1600
　Accelerating voltage 　0.2 to 30kV 　0.5 to 30kV
　Irradiation current 　1x10-12 to 1x10-6A 　1x10-12 to 2x10-7A
　Analyzed elements 　5B to 92U 　5B to 92U
　No. of WDX equipped (wavelength dispersion X-ray spectrometry) 　5-channel 　5-channel
　EDS (energy dispersion X-ray spectrometry) 　8-element simultaneous analysis -
　X-ray take off angle 　40° 　52.5°
　Surface resolution 　1μm 　1μm
Daido Bunseki Research, Inc. 2-30 Daido-cho, Minami-ku, Nagoya 457-8545 Phone: 052-611-9434 Fax: 052-611-9948