Daido Bunseki Research Inc.

Chemical Analysis
Physical Measurement
Organic Analysis
Sample Preparation
Material Evaluation
Environmental Measurement/Analysis
Analysis Examples
Equipment List
Physical Measurement
Physical Measurement

 Introduction of Analysis & Testing Equipment
 Surface/Structure Analysis Equipment: 03-07--Atomic force microscope (AFM)--

Exterior View
Exterior View (Digital Instruments Nano Scope IIIa)
 Principle A sample surface is scanned with an ultrafine probe, the atomic force working on the probe and the sample surface is converted into electrical signals, and then the sample surface can be observed at the atomic level.
 Usage With the atomic scale, a 3D image of the sample surface is obtained, and the roughness is measured.
Device specifications
 Measurement range  1μm 100μm
 Max. sample size  150mm x 12mm (height)
Daido Bunseki Research, Inc. 2-30 Daido-cho, Minami-ku, Nagoya 457-8545 Phone: 052-611-9434 Fax: 052-611-9948