・Paint component analysis with FT-IR
・Portable X-ray fluorescence analyzer
・Lithium ion battery component analysis - Al clump purity analysis
・Al purity analysis by GD-MS
・Examination of oxide morphology of pure copper via XPS analysis
・Examination of iron oxide morphology via Raman spectrometer analysis
Daido Bunseki Research, Inc. 2-30 Daido-cho, Minami-ku, Nagoya 457-8545 Phone: 052-611-9434 Fax: 052-611-9948
