Daido Bunseki Research Inc.

Chemical Analysis
Physical Measurement
Organic Analysis
Sample Preparation
Material Evaluation
Environmental Measurement/Analysis
Analysis Examples
Equipment List
Physical Measurement

We utilize the following equipment to provide our customers with the information they need.

・Microstructural Observation & Component Analysis: Scanning electron microscope (SEM), Electron Probe Micro-analyzer(EPMA), Auger electron spectrometer (AES), Atomic force microscope (AFM)
・Structural Analysis & Material Determination: X-ray diffraction(XRD), Transmission electron microscope(TEM), Fourier transform infrared spectrophotometer (FT-IR)

・Surface/Structure Analysis Equipment
 Field emission scanning electron microscope (FE-SEM)
 Electron probe micro-analyzer (EPMA)
  Field emission electron probe micro-analyzer (FE-EPMA)

 Auger electron spectrometer (AES), X-ray photoelectron

 spectrometer (AES/XPS)
 Fourier transform (microscopic) infrared spectrophotometer (FT-IR)
 Atomic force microscope (AFM)
 Transmission electron microscope (TEM)
 X-ray diffractometer (XRD)

・Physical Measurement Equipment
 ThermoGravimetic Analyzer/Differential thermal analyzer (TG/DTA)
  Differential scanning calorimeter (DSC)
 Differential thermal analyzer (DTA)
 Thermal scale
 Thermodilatometer (TMA)
 Electromotive force measurement equipment
 High-temperature Young's modulus measurement equipment
 Direct current BH characteristic measurement equipment
 Vibrating sample magnetometer
 Fully automatic transformation temperature measurement equipment (Formaster)

Daido Bunseki Research, Inc. 2-30 Daido-cho, Minami-ku, Nagoya 457-8545 Phone: 052-611-9434 Fax: 052-611-9948