Exterior View (left: Seiko Instruments Inc. SEA5220 right: Seiko Instruments Inc. SEA2001)
Principle
By irradiating the analysis sample with X-ray, core electrons within atoms are emitted out of their core.
Secondary (fluorescent) X-ray generated when outer electrons fall into the core is dispersed to each element-unique energy, and the X-ray intensity is measured electrically.
Features
(1) Few restraint on ample form
(2) Qualitative analysis done in a short time
(3) Qualitative analysis can be displayed on screen
Target samples
(1) Identification of materials examined
(2) Identification of material when mixed with foreign materials
Daido Bunseki Research, Inc. 2-30 Daido-cho, Minami-ku, Nagoya 457-8545 Phone: 052-611-9434 Fax: 052-611-9948
